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Energy Materials and Systems (EMS) Laboratory

Patents

2020 Analysis apparatus interlocking in-situ x-ray diffraction and potentiostat and analyzing methods using the same

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작성자 최고관리자 작성일 20-12-29 10:17

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출원 및 등록 국가
United States
등록년도 등록번호
Registration No.(Date) 10876980 (2020.12.29)
발명자
Yung-Eun Sung, Jungjin Park, Chunjoong Kim, Jong Sig Lee, Jae-Hyuk Park

Provided is an in-situ X-ray analysis apparatus including a potentiostat connected to an in-situ electrochemical cell and configured to adjust voltage, current, and time of the in-situ electrochemical cell or to record information regarding voltage, current, resistance, capacity, and time information of the in-situ electrochemical cell; an X-ray analysis apparatus configured to obtain X-ray diffraction information regarding the in-situ electrochemical cell; and a controller connected to the X-ray analysis apparatus and the potentiostat and configured to provide or receive signals to or from the X-ray analysis apparatus and the potentiostat.